WTi films possess an extremely low diffusion coefficient, which successfully prevents copper (Cu) atoms from migrating into the silicon substrate or dielectric layers in advanced semiconductor structures.
The active chemical properties of Titanium significantly enhance bonding strength with both the underlying substrate (such as SiO₂ and low-k materials) and the upper metal layer, preventing the film from peeling.
It features a uniform alloy phase structure for high film thickness consistency, a high sputtering rate due to high density, and optimized grain sizes that reduce nodule formation and abnormal discharges.
Yes, WTi films maintain structural stability and exhibit high oxidation resistance in PVD cavity environments ranging from 300°C to 500°C, preventing performance degradation.
WTi is widely used in logic chips (as diffusion barriers in HKMG), memory chips like DRAM (capacitive electrode contact layers), and 3D NAND (conductive adhesion layers of staircase contacts).
Yes, it adapts well to reaction sputtering in nitrogen/argon mixed atmospheres to form WTiN, and it integrates seamlessly with other film materials such as Ta/TaN, Co, and Ru.