The WSi target offers a high density of ≥9.5 g/cm³ and a high purity of ≥99.995%, which enhances sputtering efficiency and reduces overall process costs. Additionally, the controllable die size of ≤50 μm ensures surface thickness non-uniformity is kept under 3%.
It features a dense microstructure that significantly limits the release of fine particles during the sputtering process. This reduction in particle pollution directly improves device yield.
The deposited WSi film achieves a low resistivity of approximately 50–70 μΩ·cm, which lowers circuit interconnection resistance and boosts the switching speed of the finished devices.
Yes, it demonstrates outstanding thermal stability and can withstand temperatures exceeding 1000°C. This allows it to preserve chemical stability and prevent elemental diffusion during subsequent annealing processes.
It is widely used in gate engineering to replace polysilicon for CMOS metal gates, particularly in high-K metal gate processes for technologies below 28nm.
In memory manufacturing, it is used for DRAM contact layers and 3D NAND gate stacks. For power devices, it serves in gate metallization for SiC/GaN devices to withstand high-temperature operating conditions.